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Novel Materials
1.5 nm ResolutionNovel Materials
You don’t know what is really happening until you take a look. From nanorods to fracture specimens to electrospun polymers: imaging (SE, BSE, and STEM) at resolutions down to 1.5 nm. Cross-sectional FIB-milling to see beneath the surface. All analyses can be performed under cryogenic conditions to preserve/protect fragile and beam sensitive materials.